
X-RAY DIFFRACTION LABORATORY, KGL 321
Kline Geology Laboratory, P.O. Box 208109, New Haven, CT
06520-8109
A brief, introductory description of XRD analysis is provided here.
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An X-Ray diffractometer is a versatile instrument that measures the intensities of a reflected X-Ray beam from a small area. Results provide direct evidence for the atomic-level spacing within the crystal lattice of the specimen. This information can tell us details of the crystal structure for the substance ("phase") which is formed from the chemical components in the specimen. Where different phases with identical compositions occur, these can be distinguished by XRD. In addition, finer details of the crystal structure, such as the state of atomic "order", also can be derived. This detailed information can be applied to science and engineering fields as diverse as geology, archeology, materials science, metallurgy, chemistry, physics, gemology, electronics, biology, medicine, dentistry, environmental science and engineering, and forensics, to name a few.
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main Yale XRD page.